Detection method and detection device

专利名称：Detection method and detection device发明人：村山 貴紀申请号：JP2016564806申请日：20151209公开号：JP6717201B2公开日：20200701

摘要：The measurement apparatus provides a specimen on the metal film of a chiphaving a metal film and a capture body fixed on the metal film, and binds the capturebody and the substance to be detected (first step). After the first step, the measuringapparatus measures the temperature of the metal film, and determines the incidentangle of the incident light as the enhancement angle or the resonance angle based onthe information on the relationship between the temperature of the metal film and theenhancement angle or the resonance angle. (Second step). After the second step, themeasurement apparatus detects the substance to be detected by irradiating the metalfilm with incident light at an enhancement angle or a resonance angle and detecting asignal generated by the incident light (third step). .

申请人：コニカミノルタ株式会社

地址：東京都千代田区丸の内二丁目７番２号

国籍：JP

代理人：特許業務法人鷲田国際特許事務所,木曽 孝

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