专利名称：Method and apparatus for programmable
logic device (PLD) built-in-self-test (BIST)
发明人：Michael T. Moore申请号：US09602938申请日：20000623公开号：US06839873B1公开日：20050104
专利附图：
摘要：According to one embodiment, a programmable logic assembly () may include anonvolatile memory () may be coupled to an associated volatile programmable logicdevice (PLD) (). Built-in-self-test (BIST) data () may be stored in a nonvolatile memory ()
that places the volatile PLD () in a self-test configuration. If a volatile PLD () passes a self-test, user data () may be stored in a nonvolatile memory () that places a volatile PLD ()into a user determined configuration.
申请人：Michael T. Moore
地址：Santa Clara CA US
国籍：US
代理人：Bradley T. Sako
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