专利名称：APPEARANCE INSPECTION APPARATUS
AND APPEARANCE INSPECTION METHOD
发明人：AIKAWA, TETSURO,SATOH,
YOSHINORI,OCHIAI, MAKOTO,ADACHI,HIROYUKI
申请号：EP08752026申请日：20080424公开号：EP2141912A4公开日：20160713
摘要：Visibility of defects is improved for inspection of structures and the like, bygenerating an image having higher resolution than pixel resolution of a TV camera itself.An appearance inspection apparatus is provided with a TV camera (101); a camera drivingdevice (102) for making the TV camera scan an inspection object; an image capture device(105) for capturing the image in the TV camera as a digital image; a camera motionmeasuring device (104) for measuring scanning motion of the TV camera; a high definitionimage generating device (106), which generates a high definition image having a higherpixel resolution than that of the TV camera, based on the digital images captured by theimage capture device and the TV camera scanning motion data measured by the cameramotion measuring device; and a recording device (108) which records and storespositional information of the inspection object.
申请人：KABUSHIKI KAISHA TOSHIBA
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